Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1997-03-31
1999-11-16
Nguyen, Vinh P.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324 731, 3241581, G06F 1520, G01R 3100
Patent
active
059864621
ABSTRACT:
A testing device to test and troubleshoot APUs that is designed to be small, rugged, light weight, and easily adaptable to many different APU applications. Using a special multi-wire cable system, test and monitor circuits are imposed between the APU control panel and the ECU and also between the ECU and the LRUs. LRU electrical circuits are subjected to short electrical pulses and the resulting current flow is monitored. Defective LRUs are detected by a very low or zero current measurement indicating an open circuit or by an excess current flow indicating a short circuit. The testing device does not include standard monitoring equipment such as voltmeters and oscilloscopes which would require calibration. Instead, the APU Tester's signal selector equipment routes a selected APU signal to the APU Tester's front panel test jacks for easy monitoring of circuit resistance and signal characteristics using standard external monitoring equipment which can be separately calibrated. The testing device provides signal buffer circuits and signal latch circuits to furnish a record indicating if signals are transmitted between the APU's LRUs. The testing device uses APU power (from either the APU battery or the APU generator) as its sole power source allowing the APU Tester to be used even in those situations where standard power is unavailable.
REFERENCES:
patent: 3764814 (1973-10-01), Griffith
patent: 5033010 (1991-07-01), Lawrence et al.
patent: 5079707 (1992-01-01), Bird et al.
patent: 5146160 (1992-09-01), Pinkston
patent: 5235803 (1993-08-01), Rodgers
Kuck Burton M.
Thomas Daniel T.
Applied Data Technology, Inc.
Nguyen Vinh P.
Ross John R.
Ross III John R.
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