Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2008-04-15
2008-04-15
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C375S256000
Reexamination Certificate
active
11519686
ABSTRACT:
The invention relates to an automation device (100, 100′), in which a multiplicity of physically distributed functional units communicate with each other by means of a common transmission protocol. The device has a microcontroller (110), which is assigned at least one clock generator (120) and one memory unit (150), and which is connected at least to one data source (140), which is designed to output a data bit-stream to be transmitted.
REFERENCES:
patent: 4104637 (1978-08-01), Nielson
patent: 4521879 (1985-06-01), Gueldenpfennig et al.
Kresse Heiko
Schaeffer Ralf
Stelter Andreas
ABB Patent GmbH
Bui Bryan
Katterle Paul
Rickin Michael
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