Automatically testing a plurality of memory arrays on selected m

Details Automatically testing a plurality of memory arrays on selected m Automatically testing a plurality of memory arrays on selected m

1983-09-28

1986-08-12

Atkinson, Charles E.

Excavating

324 73R, 371 21, G06F 3128

Patent

active

046060251

ABSTRACT:
A system for automatically testing a plurality of memory arrays on selected memory array testers includes an interactive data entry device for entering array test specifications including characterizing information, DC testing parameters, AC testing parameters and AC test pattern choices for the array. The test specifications are entered in a format which is independent of a particular tester's characteristics. A universal language generator generates a tester independent universal language instruction sequence for carrying out the prescribed tests based upon the entered test specifications. Associated with each tester is a universal language translator which translates the tester independent universal language instruction sequence into an instruction sequence which is particular to the associated tester. The tester dependent instruction sequence may be loaded into the associated tester to produce the test signals for testing the memory array.

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