Automatically selecting wafers for review

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing

Reexamination Certificate

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Details

C700S121000, C702S035000, C702S181000, C716S030000, C716S030000, C438S016000

Reexamination Certificate

active

07324863

ABSTRACT:
In one embodiment, the present invention includes a method for receiving a set of inspection files each corresponding to an inspection performed on a wafer of a set of wafers, automatically analyzing the set of inspection files to select at least one inspection file corresponding to a predetermined rule set, and identifying the wafer(s) associated with the selected inspection file(s). Other embodiments are described and claimed.

REFERENCES:
patent: 6477685 (2002-11-01), Lovelace
patent: 6701259 (2004-03-01), Dor et al.
patent: 6985830 (2006-01-01), Lee et al.
patent: 7103505 (2006-09-01), Teshima et al.
patent: 2003/0120459 (2003-06-01), Lee et al.
patent: 2003/0135295 (2003-07-01), Dor et al.

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