Data processing: software development – installation – and managem – Software program development tool – Testing or debugging
Reexamination Certificate
2011-01-18
2011-01-18
Pham, Thomas K (Department: 2191)
Data processing: software development, installation, and managem
Software program development tool
Testing or debugging
C717S131000, C717S104000, C717S106000
Reexamination Certificate
active
07873945
ABSTRACT:
The present invention extends to methods, systems, and computer program products for automatically generating test cases for binary code. Embodiments of the present invention can automatically generate test inputs for systematically covering program execution paths within binary code. By monitoring program execution of the binary code on existing or random test cases, branch predicates on execution paths can be dynamically inferred. These inferred branch predicates can then be used to drive the program along previously unexplored execution paths, enabling the learning of further execution paths. Embodiments of the invention can be used in combination with other analysis and testing techniques to provide better test coverage and expose program errors.
REFERENCES:
patent: 5542043 (1996-07-01), Cohen et al.
patent: 5754760 (1998-05-01), Warfield
patent: 6002869 (1999-12-01), Hinckley
patent: 6249882 (2001-06-01), Testardi
patent: 6421822 (2002-07-01), Pavela
patent: 6601018 (2003-07-01), Logan
patent: 6944848 (2005-09-01), Hartman et al.
patent: 7024589 (2006-04-01), Hartman et al.
patent: 7055065 (2006-05-01), Farchi et al.
patent: 7707553 (2010-04-01), Roques et al.
patent: 2003/0097650 (2003-05-01), Bahrs et al.
patent: 2003/0204784 (2003-10-01), Jorapur
patent: 2004/0025083 (2004-02-01), Nanja et al.
patent: 2004/0181713 (2004-09-01), Lambert
patent: 2005/0160321 (2005-07-01), Cleaveland et al.
patent: 2005/0229044 (2005-10-01), Ball
patent: 2006/0010429 (2006-01-01), Ihara
patent: 2006/0253739 (2006-11-01), Godefroid et al.
patent: 2008/0178154 (2008-07-01), Basler et al.
Beyleda et al. “BINTEST—search-based test case generation” Computer Software and Application Conference, 2003. COMPSAC 2003. Proceedings 27th Annual International Publication Year: 2003, pp. 28-33.
Paradkar et al. “Automatic test-generation for predicates [software testing]” Reliability, IEEE Transactions on, vol. 45, Issue: 4, pp. 515-530.
Gao, Haichang, et al., “A kind of SAaGA Hybrid Meta-heuristic Algorithm for the Automatic Test Data Generation”, 2005 IDDD, pp. 111-114.
Korel, Bogdan, “Automated Software Test Data Generation”, IEEE Transactions on Software Engineering, vol. 16 No. 8, Aug. 1990, pp. 870-879.
Liu, Hui, “Automated Verification and Test Case Generation for Input Validation”, AST'06, May 23, 2006, Shanghai, China, 2006 ACM, pp. 29-35.
Yin, Huifang, et al., “Automatic Test Generation using Checkpoint Encoding and Antirandom Testing”, Computer Science Technical Report, Colorade State University, Proceedings of the Eighth International Symposium on Software Reliability Engineering (ISSRE 1997) pp. 1-19.
Musuvathi Madanlal
Tan Lin
Microsoft Corporation
Pham Thomas K
Workman Nydegger
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