Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-04-18
2006-04-18
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
07031856
ABSTRACT:
A system and method for automatically determining a dielectric constant for a cable of known length for use in a Time Domain Reflectometer (TDR) are disclosed. The TDR mode is set to time mode. A waveform for the cable is acquired from the TDR. The waveform indicates the time of a round trip distance of a signal through the cable. The length of the cable is entered via a programmed operator entry. A Velocity of Propagation (VOP) is calculated based on the length of the cable and the time of the round trip distance. The dielectric constant is then calculated based on the calculated VOP.
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Frank Marguerite A.
Teich Stanley
Barlow John
Northrop Grumman Corporation
Pretlow Demetrius
Stetina Brunda Garred & Brucker
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