Automatic wafer prober with programmable tester interface

Electricity: measuring and testing – Plural – automatically sequential tests

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324158R, G01R 3102

Patent

active

045008361

ABSTRACT:
An automatic wafer prober is interfaced with any one of a number of different die testers by storing in memory associated with the wafer prober a plurality of sets of data there being one set of data for each of a plurality of different die testers to be interfaced to the prober. Each set of data defines at least the sense (polarity) of a plurality of test result output signals derived from the particular die tester to be interfaced with the prober. The proper set of stored data is selected by the operator, such as by a digital switch, and a microprocessor employs the selected set of data for modifying the sense of the test result output signals derived from the die tester as fed into the wafer prober so that the die tester output signals as fed into the wafer prober are the same for any one of the plurality of different die tester. In a preferred embodiment, the microprocessor generates a test start signal which is outputted from the prober to the die tester. The pulse width of the test start signal as required by the particular die tester is stored in the set of data determinative of the polarity of the test result signals and is selected and employed by the microprocessor for selecting the proper pulse width of the test start signal.

REFERENCES:
patent: 3963986 (1976-06-01), Morton et al.
patent: 3970934 (1976-07-01), Aksu

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Automatic wafer prober with programmable tester interface does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Automatic wafer prober with programmable tester interface, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Automatic wafer prober with programmable tester interface will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-615400

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.