Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1994-02-14
1995-05-09
Wieder, Kenenth A.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324 731, 3241581, G01R 104
Patent
active
054143730
ABSTRACT:
An automatic transistor checking method is provided, whereby an unknown, bipolar transistor may be typed, pinned and checked for forward DC gain, H.sub.fe. The method is suitable for portable instruments, because the method uses little battery current to perform the H.sub.fe measurement. The method automatically determines transistor type (NPN or PNP) and pinout, making it suitable for quick checking of batches of unknown devices.
REFERENCES:
patent: 5355082 (1994-10-01), Schreiber et al.
Curtis Douglas R.
Schreiber Paul T.
Bowser Barry C.
Tandy Corporation
Wieder Kenenth A.
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