Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1992-03-27
1994-10-11
Nguyen, Vinh
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324 731, 3241581, G01R 3102
Patent
active
053550820
ABSTRACT:
An automatic transistor checking method is provided, whereby an unknown, bipolar transistor may be typed, pinned and checked for forward DC gain, H.sub.fe. The method is suitable for portable instruments, because the method uses little battery current to perform the H.sub.fe measurement. The method automatically determines transistor type (NPN or PNP) and pinout, making it suitable for quick checking of batches of unknown devices.
REFERENCES:
patent: 2946008 (1960-07-01), Kallmann
patent: 3356945 (1967-12-01), Ryan et al.
patent: 3430152 (1969-02-01), Walsh
patent: 3676767 (1972-07-01), Boelter
patent: 4438498 (1984-03-01), Sekel et al.
patent: 4458197 (1984-07-01), Robinson
patent: 4492916 (1985-01-01), Johnson
patent: 4563770 (1986-01-01), Lemelson et al.
patent: 4608532 (1986-08-01), Ibar et al.
patent: 4736327 (1988-04-01), Power
patent: 4779043 (1988-10-01), Williamson, Jr.
patent: 4794383 (1988-12-01), Havel
patent: 4864512 (1989-09-01), Coulson et al.
patent: 4924177 (1990-05-01), Mulz
Curtis Douglas R.
Schreiber Paul T.
Nguyen Vinh
Tandy Corporation
LandOfFree
Automatic transistor checker does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Automatic transistor checker, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Automatic transistor checker will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1661482