Automatic transistor checker

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

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Details

324 731, 3241581, G01R 3102

Patent

active

053550820

ABSTRACT:
An automatic transistor checking method is provided, whereby an unknown, bipolar transistor may be typed, pinned and checked for forward DC gain, H.sub.fe. The method is suitable for portable instruments, because the method uses little battery current to perform the H.sub.fe measurement. The method automatically determines transistor type (NPN or PNP) and pinout, making it suitable for quick checking of batches of unknown devices.

REFERENCES:
patent: 2946008 (1960-07-01), Kallmann
patent: 3356945 (1967-12-01), Ryan et al.
patent: 3430152 (1969-02-01), Walsh
patent: 3676767 (1972-07-01), Boelter
patent: 4438498 (1984-03-01), Sekel et al.
patent: 4458197 (1984-07-01), Robinson
patent: 4492916 (1985-01-01), Johnson
patent: 4563770 (1986-01-01), Lemelson et al.
patent: 4608532 (1986-08-01), Ibar et al.
patent: 4736327 (1988-04-01), Power
patent: 4779043 (1988-10-01), Williamson, Jr.
patent: 4794383 (1988-12-01), Havel
patent: 4864512 (1989-09-01), Coulson et al.
patent: 4924177 (1990-05-01), Mulz

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