X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1989-09-13
1991-06-04
Westin, Edward P.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 57, 378 87, 382 51, 382 41, 382 16, 382 18, G01N 23201
Patent
active
050220624
ABSTRACT:
Automatic thread detection in association with imaging with relies on a backscatter detector and illumination by a flying spot source of penetrating radiation. The digital backscatter image is processed to produce a histogram. The histogram is compared to a predetermined threat characteristic and an alarm is sounded if the histogram exceeds the threat characteristic. The threat characteristic is derived in an empirical fashion and automatically modified based on sensing selected parameters associated with the scanning. Operator control over the threat characteristic is also implemented. The flying spot source is also associated with a transmit detector to produce a transmit image. The transmit image is also processed against predetermined parameters for threat assessment. The predetermined parameters are also operator variable.
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American Science and Engineering, Inc.
Chu Kim-Kwok
Westin Edward P.
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