Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2006-09-26
2006-09-26
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S064000, C702S057000, C324S607000, C324S511000, C340S650000, C361S093900, C361S091100, C714S724000, C714S740000
Reexamination Certificate
active
07113882
ABSTRACT:
An automatic testing system. A sampling and converting device obtains a plurality of electronic parameters from a tested device and transforms them into a plurality of digital signals. A microprocessor receives the digital signals and performs various short-circuit tests, over-current tests and over-voltage tests in a specific sequence.
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Lee et al., ‘A Microcomputer-Based Testing Station for Dynamic and Static Testing of Protective Relay Systems’, Jan. 1995, IEEE Article, pp. 163-168.
Harada et al., ‘A New Vertical IGBT Structure with Monolithic Over Current, Over-Voltage, and Over Temperature Sensing and Protecting Circuit’, Sep. 1995, IEEE Publication, vol. 16, No. 9, pp. 399-401.
Liu Ken-Ho
Mao Chang-Gen
Wang Li-Ping
Zhang Hua-Liang
Delta Eletronics, Inc.
Desta Elias
Hoff Marc S.
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