Automatic testing of electrical circuitry



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324 73R, G06F 1100, G01R 1512




By means of contact pins fixed on a plate, test signals may be applied to points in a logic circuit to be tested, the signals being applied for such short periods of time as not to damage components in the circuitry. High speed switches can be individually enabled so as to pre-select any particular one or ones of the contact pins, and a pulsed voltage source then momentarily energizes the pre-selected pins. Output signals are read via other switches connected to the contact pins. The high speed switches are electronic. Control means controls the switches in accordance either with pre-programmed information or with information fed in. In the latter case the fed-in information is then automatically transferred to enable it to be used again if that circuit type is tested in the future.

patent: 3924109 (1975-12-01), Jhu et al.
patent: 4108358 (1978-08-01), Niemaszyk et al.
patent: 4180203 (1979-12-01), Masters


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