Automatic testing of digital logic systems

Details Automatic testing of digital logic systems Automatic testing of digital logic systems

1975-04-15

1976-10-26

Demeo, Palmer C.

Electricity: measuring and testing

Plural, automatically sequential tests

324 73R, 235153AC, 235153AP, G01R 1512, G06F 1520

Patent

active

039886700

ABSTRACT:
Automatic testing of digital sequential logical devices employing a read y memory programmed with a series of inputs. The read only memory programmed outputs are then compared in EXCLUSIVE OR gates with the outputs of the device under test.

REFERENCES:
patent: 3581074 (1971-05-01), Waltz
patent: 3597682 (1971-08-01), Hubbs et al.
patent: 3784907 (1974-01-01), Eichelberger
patent: 3784910 (1974-01-01), Sylvan
patent: 3873818 (1975-03-01), Barnard
patent: 3892954 (1975-07-01), Neuner
patent: 3892955 (1975-07-01), Maejima

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