Automatic testing method and testing apparatus for devices

Details Automatic testing method and testing apparatus for devices Automatic testing method and testing apparatus for devices

1994-01-19

1995-05-09

Teska, Kevin J.

Boots, shoes, and leggings

364579, 324 731, 371 161, G01D 2100, G01R 3100, G06F 1100

Patent

active

054146399

ABSTRACT:
In a testing method and a testing circuit design apparatus for a multi-terminal device, the testing circuit design apparatus includes an input unit for inputting data of an ideal testing circuit, a storage unit for storing the data of the ideal testing circuit input from the input unit, a knowledge base unit having a knowledge base in which a knowledge base and a testing method suitable for a tester of each manufacturer are described, and a testing circuit conversion unit for converting the data of the ideal testing circuit written in the storage unit to data of an actual testing circuit actually used for characteristic measurement on the basis of each knowledge base of the knowledge base unit, and for writing the converted data into the storage unit. The number n of points under test of the device board and the number M of resources of the tester are read out, and the number n of the points under test and the number M of the resources are compared with each other. The tester and the device board are connected to each other in accordance with a comparison result.

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