Automatic testing device for signal evaluation

Details Automatic testing device for signal evaluation Automatic testing device for signal evaluation

1998-01-14

2000-05-02

Ballato, Josie

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Parameter related to the reproduction or fidelity of a...

324 7623, 455 673, 455 676, G01R 2700

Patent

active

060576901

ABSTRACT:
A phase noise measurement system including a low noise programmable synthesizer and a receiver/down converter is provided. The low noise synthesizer provides L-Band Signals which can selectively exhibit low noise close-in or low noise far out. The receiver down converter provides for absolute, additive, and down converted/direct/multiple phase noise measurement.

REFERENCES:
patent: 4748399 (1988-05-01), Caldwell
patent: 5053714 (1991-10-01), Durand
patent: 5179344 (1993-01-01), Najle
patent: 5337014 (1994-08-01), Najle
patent: 5412325 (1995-05-01), Meyers
patent: 5608331 (1997-03-01), Newberg

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