Automatic tester for microprocessor board

Registers – Systems controlled by data bearing records – Time analysis

Patent

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Details

324 73R, G06F 1100, G01R 3100

Patent

active

041257634

ABSTRACT:
An apparatus for testing circuit board systems utilizing microprocessors which includes means for selectively exercizing each terminal or pin of the board system during each step of the testing protocol. Each step of the protocol can be preselected to operate according to an automatic sequence or according to a preprogrammed manner, or the apparatus may be conditioned to receive a response from the circuit board system at a selected terminal during a selected step of the testing protocol. The testing apparatus further includes an interactive interface to permit the board system under test to control the speed and sequence of the test procedure. The testing apparatus is capable of exercizing the board systems under test in a simulated environment at typically normal operating speeds so that degradation of system performance related to operational speed and other factors found in an operating environment can be analyzed.

REFERENCES:
patent: 3831149 (1974-08-01), Job
patent: 3832535 (1974-08-01), De Vito
patent: 3873818 (1975-03-01), Barnard
patent: 3924109 (1975-12-01), Jhu et al.
patent: 3931506 (1976-01-01), Borrelli et al.
patent: 4012625 (1977-03-01), Bowen et al.

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