Automatic tester for complex semiconductor components including

Details Automatic tester for complex semiconductor components including Automatic tester for complex semiconductor components including

1976-08-06

1977-08-23

Ruggiero, Joseph F.

Registers

Transfer mechanism

Traveling pawl

324 73R, 2351505, G06F 1100, G01R 1512

Patent

active

040442446

ABSTRACT:
Logic and analog functions in a complex semiconductor component are stuck fault and parametrically tested through an analog/digital measurement adapter coupled to logic and analog testers. Both logic and analog testers are under computer control whose purpose is to direct the testing sequence, log test results, perform algorithmic calculations on the data and diagnose failing devices in the component under test. The adapter provides the electrical environment to match a range of components under test to the logic and analog testers. The adapter is also under computer control to permit impedance matching of a multiplicity of digitally controlled stimulus/response units connected through a multiplexor to the range of components under test.

REFERENCES:
patent: 3622876 (1971-11-01), Ure et al.
patent: 3816813 (1974-06-01), Jehu

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