Automatic test vector generation method, test method making...

Details Automatic test vector generation method, test method making... Automatic test vector generation method, test method making...

2005-01-18

2005-01-18

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

Reexamination Certificate

active

06845335

ABSTRACT:
A technique for automatically generating test vectors comprises an ISA specification analysis step of analyzing specifications of an instruction set architecture (ISA) of a processor (S101); a test vector generation data preparation step of preparing data required for generating test vectors (S103); and a test vector generation step of generating test vectors by the use of said data (S105).

REFERENCES:
patent: 4652992 (1987-03-01), Mensch, Jr.
patent: 6115763 (2000-09-01), Douskey et al.

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