Automatic test program generation method

Details Automatic test program generation method Automatic test program generation method

2008-04-22

2008-04-22

Paladini, Albert W. (Department: 2125)

Data processing: software development, installation, and managem

Software program development tool

Testing or debugging

C717S126000

Reexamination Certificate

active

10760366

ABSTRACT:
Architecturally complicated computers require functionally complicated compiler. For such a compiler, the present invention provides an automatic compiler test program generation method capable of reducing the man-hour required to prepare a test program and testing many aspects of the compiler.By a random number-used method, a plurality of program cells are selected from a set of program cells each of which may form an element of a test program. The selected program cells are combined into a test program.

REFERENCES:
patent: 4014777 (1977-03-01), Brown
patent: 4081656 (1978-03-01), Brown
patent: 4200062 (1980-04-01), Duckworth
patent: 4369737 (1983-01-01), Sanders et al.
patent: 4622924 (1986-11-01), Lewis
patent: 4726888 (1988-02-01), McCambridge
patent: 5231954 (1993-08-01), Stowe
patent: 5244558 (1993-09-01), Chiang
patent: 5401371 (1995-03-01), Oshima et al.
patent: 5437250 (1995-08-01), Rabinovich et al.
patent: 5628885 (1997-05-01), Lin
patent: 5692122 (1997-11-01), Bird
patent: 5711865 (1998-01-01), Caesar
patent: 5843292 (1998-12-01), Spiros
patent: 5997223 (1999-12-01), Spiros
patent: 6209493 (2001-04-01), Ross
patent: 6223337 (2001-04-01), Blume
patent: 6299656 (2001-10-01), Richardson, Jr. et al.
patent: 6322757 (2001-11-01), Cohn et al.
patent: 6430741 (2002-08-01), Mattson et al.
patent: 6507809 (2003-01-01), Yoshino et al.
patent: 6560958 (2003-05-01), Bromberg et al.
patent: 6880154 (2005-04-01), Ghosh et al.
patent: 7065631 (2006-06-01), Weaver

Affiliated with

Also associated with

Rating

Automatic test program generation method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Automatic test program generation method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Automatic test program generation method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3935180