Automatic test probe positioning apparatus

Details Automatic test probe positioning apparatus Automatic test probe positioning apparatus

1979-08-10

1981-06-16

Haroian, Harry N.

Geometrical instruments

Area integrators

Electrical

33 1M, G01B 500, B27G 2300

Patent

active

042728924

ABSTRACT:
A test probe positioning machine includes first and second stepper motors connected to spaced first and second vertical pivot pins extending from a support. A flat slide surface is disposed on the support adjacent and perpendicular to the vertical pivot pins. First and second elongated threaded shafts driven by the stepper motors engage first and second threaded nut blocks. The nut blocks are pivotally connected together by a vertical pivot pin and are supported upon a low friction foot element which slides along the slide surface. An insulating probe support is connected to one of the nut blocks and can be raised or lowered by a solenoid in response to a control signal received from a control system. The control system converts triangular coordinates to pulse signals which control the stepper motors to position the probe support.

REFERENCES:
patent: 2093048 (1937-09-01), Ike
patent: 2794594 (1957-06-01), Ergen et al.
patent: 3495519 (1970-02-01), Alfsen et al.
patent: 3918167 (1975-11-01), Gerber

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