Classifying – separating – and assorting solids – Sorting special items – and certain methods and apparatus for... – Condition responsive means controls separating means
Patent
1996-06-27
1999-02-02
Terrell, William E.
Classifying, separating, and assorting solids
Sorting special items, and certain methods and apparatus for...
Condition responsive means controls separating means
209571, 209573, B07C 5344
Patent
active
058653198
ABSTRACT:
An automatic test handler system for automatically supplying IC devices to be tested to an IC tester and sorting the tested IC devices based on the test results. The system includes a testing machine for testing the IC devices by contacting the IC devices with test contactors. Test signals are provided from the IC tester and the resulting signals from the IC devices are received. The testing machine is installed in a test room in which dust, temperature and humidity are controlled in a high degree. A sorting machine is installed outside of the test room for sorting the IC devices that have been tested based on the test results. The sorting machine has a plurality of sort stations for receiving the IC devices based on categories defined in the test results. Tray cassettes hold a plurality of IC trays containing the IC devices, and both the tray cassettes and IC trays are provided with identification numbers. The trays are horizontally transferred on the testing machine and the sorting machine, and a data communication network connected between the testing machine and the sorting machine transmits the test results and position information of the IC devices in the IC trays.
REFERENCES:
patent: 4544318 (1985-10-01), Nagatomo et al.
patent: 4805759 (1989-02-01), Rochet et al.
patent: 5313156 (1994-05-01), Klug et al.
patent: 5321885 (1994-06-01), Hino et al.
Hayama Hisao
Kojima Katsumi
Nemoto Shin
Okuda Hiroshi
Advantest Corp.
Deuble Mark
Terrell William E.
LandOfFree
Automatic test handler system for IC tester does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Automatic test handler system for IC tester, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Automatic test handler system for IC tester will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1109459