Automatic test generation for model-based real-time fault diagno

Boots – shoes – and leggings

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

364185, 36455101, 364578, 371 23, G05B 902, G06G 748

Patent

active

052145778

ABSTRACT:
In a real-time diagnostic system, an alarm sequence generator is used to test the correctness of a fault model. The fault model describes an industrial process being monitored. The alarm sequence generator reads the fault model and generates a user interface, from which specific components can be selected for failure at specified times. The alarm sequence generator assembles all alarms that are causally downstream from the selected set of faulty components and determines which alarms should be turned on based on probabilistic and temporal information in the fault model. The timed alarm sequence can be used by an expert to measure the correctness of a particular model, or can be used as input into a diagnostic system to measure the correctness of the diagnostic system.

REFERENCES:
patent: 4755925 (1988-07-01), Tsuchiya et al.
patent: 4878179 (1989-10-01), Larsen et al.
Padalkar et al, Proc. of the Fourth Conf. of Artificial Intelligence for Space Applns., pp. 115-124, 1988.
Sztipanovits et al, International Journal of Intelligent Systems, vol. 3, pp. 269-280, 1988.
Sztipanovits et al, Proceedings of the Third IEEE Conf. on Artificial Intelligence Applications, pp. 126-133, 1987.
Sztipanovits et al, Proceedings of the NASA/JPL Symposium on Telerobotics, pp. 131-139, 1987.
Biegl et al, Innovation et Technologie en Biologie et Medicine, vol. 10, No. 2, pp. 205-216, Feb. 1989.
Sztipanovits et al, Coupling Symbolic & Numerical Computing in Expert Systems, II, pp. 117-128, 1988.
Sztipanovits, Measurement, vol. 7, No. 3, pp. 98-108, Jul.-Sep. 1989.
Sztipanovits et al, Biomed Meas Infor Contr, vol. 1, No. 3, pp. 140-146, 1986.
Sztipanovits et al, IEEE/Seventh Annual Conf. of the Engineering in Medicine & Biology Society, pp. 1132-1136, 1985.
Sztipanovits, Proceedings of the IEEE International Symposium on Circuits & Systems, pp. 2359-2362, 1988.
Blokland et a., Proceedings of the American Control Conf. pp. 620-626, 1988.
Karsai et al, Proceedings of the American Control Conf., 1988.
Karsai et al, Proceedings of the IEEE Symposium of Intelligent Control, pp. 4650-4656, 1988.
Sztipanovits et al, Robotics & Automation, May 1990.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Automatic test generation for model-based real-time fault diagno does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Automatic test generation for model-based real-time fault diagno, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Automatic test generation for model-based real-time fault diagno will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-902542

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.