Automatic test equipment system using pin slice architecture

Details Automatic test equipment system using pin slice architecture Automatic test equipment system using pin slice architecture

1990-09-05

1993-07-06

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, 371 151, 371 223, G01R 3128

Patent

active

052257720

ABSTRACT:
A plurality of "pin slice" circuits, each associated with a separate pin of the device under test (DUT). Each pin slice circuit contains its own memory and registers and circuitry for generating the necessary test signals. Test data is loaded into the individual pin slice circuits in a vertical word fashion, such that all of the bits of the vertical word correspond to the individual pin, allowing the characteristics of an individual pin test sequence to be varied independently of the other pins. A participate memory is used to select different groupings of the pin slice circuits which are to be programmed in parallel when a group of pins are to receive the same test signals. Separate enable signals to the various stages of the pin slice circuits allow different aspects of the test pattern to be also varied independently.

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