Automatic test equipment platform architecture using...

Details Automatic test equipment platform architecture using... Automatic test equipment platform architecture using...

2007-08-30

2009-06-16

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Including multiple test instruments

C702S118000, C714S733000, C714S742000, C324S763010, C324S765010

Reexamination Certificate

active

07548828

ABSTRACT:
The present invention provides a system of testing semiconductor devices. The system comprises a central host computer, an array of user computers (the array), and a HU (Host-User) network as the mean of communication between them. Two user computers are dedicated to one test instrument via UI connections in the instrument test head, a first user computer can be assigned to perform the tasks of generating and delivering data to the test instrument, while a second user computer can be assigned to perform the tasks of receiving and processing information from the same test instrument.

REFERENCES:
patent: 4707834 (1987-11-01), Frisch et al.
patent: 6018814 (2000-01-01), Rockoff
patent: 7385385 (2008-06-01), Magliocco et al.
patent: 2003/0208713 (2003-11-01), Evans
patent: 2005/0261856 (2005-11-01), Kushnick et al.
patent: 2008/0030203 (2008-02-01), Chung et al.

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