Automatic test equipment for integrated circuits

Electricity: measuring and testing – Plural – automatically sequential tests

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324158R, 371 25, G01R 19165, G01R 1910

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active

047630663

ABSTRACT:
The apparatus (10) includes a semiconductor tester (12) which in operation produces an analog signature signal relative to a circuit node of an electronic circuit, such as a pin connection of an integrated circuit. The analog signature signal is the result of horizontal and vertical signals which are also directed to an integrator/A-D converter (44) which produces therefrom a set of four digital signals representing said analog signature. These digital signals are then compared in a computer (50) against reference digital values for the same circuit node of the same electronic circuit which is known to be good. If the digital signals are not within a selected range relative to the reference digital values, the analog signature of the circuit node is displayed for inspection and evaluation by an operator.

REFERENCES:
patent: 3889053 (1975-06-01), Lloyd et al.
patent: 3991302 (1976-11-01), Danner
patent: 4358732 (1982-11-01), Johnston et al.
patent: 4471298 (1984-09-01), Frohlich
patent: 4510571 (1985-04-01), Dagostino et al.
patent: 4555765 (1985-11-01), Crooke et al.
patent: 4565966 (1986-01-01), Burr et al.
patent: 4631699 (1986-12-01), Siwik et al.
patent: 4641246 (1987-02-01), Halbert et al.
"Microcomputer-Based Power-Semiconductor-Circuit Waveform Analyser", by Pendergast et al, IEE Proc., vol. 127, pt. B, #6, 11/80, pp. 363-367.
"Advanced Waveform Recorders Do More Than Capture Transients"; by Dedinas, EDN, 9/5/78, pp. 103-110.

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