Automatic ranging apparatus and method for precise integrated ci

Details Automatic ranging apparatus and method for precise integrated ci Automatic ranging apparatus and method for precise integrated ci

1997-10-30

2000-08-08

Hoff, Marc S.

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

702117, 324763, 324765, 714734, G01R 2700

Patent

active

061014583

ABSTRACT:
A computer-based test method and apparatus for measuring DC current drawn by an integrated circuit. The apparatus has a plurality of current measurement ranges and is first initialized to a selected one of the measurement ranges. Next, the apparatus measures the DC current drawn by the integrated circuit in the selected measurement range and increments the selected measurement range if the measured DC current is out of the selected measurement range. The apparatus repeats the steps of measuring and incrementing until the measured DC current is in the selected measurement range. The measured DC current is then compared to a specification limit for the integrated circuit.

REFERENCES:
patent: 4517512 (1985-05-01), Petrich et al.
patent: 4523312 (1985-06-01), Takeuchi
patent: 4646299 (1987-02-01), Schinabeck et al.
patent: 5773990 (1998-06-01), Wilstrup et al.
patent: 5917331 (1999-06-01), Persons

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