Automatic particle analyzing system

Details Automatic particle analyzing system Automatic particle analyzing system

2006-12-26

2006-12-26

Lauchman, Layla G. (Department: 2877)

Optics: measuring and testing

For size of particles

C356S337000, C356S336000

Reexamination Certificate

active

07154600

ABSTRACT:
A method and an apparatus for automatic analysis of particle size distribution, shape and color. The method includes collection of a particle sample, where the particles are distributed into a substantially monolayer particle curtain to be exposed to a light source for providing imaging and subsequent analysis of the particles. The apparatus has a sampling device that collects samples from the product stream integrated in the system.

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patent: 0 252 407 (1988-01-01), None
patent: 62-175645 (1987-08-01), None
patent: 01/84115 (2001-11-01), None

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