Automatic parametric self-testing and grading of a hardware syst

Details Automatic parametric self-testing and grading of a hardware syst Automatic parametric self-testing and grading of a hardware syst

1994-11-28

1996-12-10

Canney, Vincent P.

Excavating

39518305, G06F 1100

Patent

active

055838758

ABSTRACT:
Automatic parametric testing of a system can be achieved by varying a parameter such as speed, voltage, and/or temperature, and then monitoring system performance. Such testing can be used to determine whether a given system meets specifications and performance variations from system to system.

REFERENCES:
patent: 4623837 (1986-11-01), Efron et al.
patent: 5030905 (1991-07-01), Figal
patent: 5438599 (1995-08-01), Lincoln

Affiliated with

Also associated with

Rating

Automatic parametric self-testing and grading of a hardware syst does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Automatic parametric self-testing and grading of a hardware syst, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Automatic parametric self-testing and grading of a hardware syst will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-430168