Automatic optical inspection system

Details Automatic optical inspection system Automatic optical inspection system

1985-04-08

1988-12-27

Boudreau, Leo H.

Image analysis

Histogram processing

For setting a threshold

358106, 382 36, G06K 900

Patent

active

047946474

ABSTRACT:
An automatic optical inspection system, for inspecting printed circuit boards and the like, employs so-called dimensional verification and pattern recognition techniques simultaneously. The printed circuit board is scanned by means of a CCD camera to produce a binarized image of the board. The image is stored and access provided to a set of picture elements arranged in a generally circular configuration and which are spaced apart by a dimension to be monitored by dimensional verification (DV) means. Access is also provided to a second set of picture elements arranged in a generally rectangular array of picture elements for the pattern recognition (PR) means, which uses template matching to determine their validity. The DV and PR outputs are weighted and clustered before a fault is signalled.

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patent: 4628531 (1986-12-01), Okamoto
patent: 4668982 (1987-05-01), Tinnerino
patent: 4692943 (1987-09-01), Pietzsch

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