Automatic model-based testing

Data processing: software development – installation – and managem – Software program development tool – Testing or debugging

Reexamination Certificate

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C717S125000, C717S126000, C717S127000, C714S038110, C714S039000, C715S763000

Reexamination Certificate

active

07979849

ABSTRACT:
Automatic model-based testing is disclosed, including receiving a set of objects associated with a computer program application under test; automatically classifying the objects as state objects representing states of the application, or transition objects representing transitions in the application from one state to another state, or static information objects; linking the state objects with the transition objects to result in creating a model in memory of all states and transitions provided by the application; associating, in the model, one or more tests with one or more of the state objects; creating and storing, based on the states and transitions, a finite state machine that represents execution behavior of the application according to the model; and testing the application by (a) automatically navigating the finite state machine and (b) providing state and transition data from the finite state machine to a graphical user interface functional test application that executes the one or more tests upon reaching the states represented by the state objects.

REFERENCES:
patent: 5394347 (1995-02-01), Kita et al.
patent: 5870539 (1999-02-01), Schaffer
patent: 5870590 (1999-02-01), Kita et al.
patent: 6038378 (2000-03-01), Kita et al.
patent: 6059837 (2000-05-01), Kukula et al.
patent: 6144962 (2000-11-01), Weinberg et al.
patent: 6237006 (2001-05-01), Weinberg et al.
patent: 6360332 (2002-03-01), Weinberg et al.
patent: 6385741 (2002-05-01), Nakamura
patent: 6446120 (2002-09-01), Dantressangle
patent: 6462762 (2002-10-01), Ku et al.
patent: 6577982 (2003-06-01), Erb
patent: 6775824 (2004-08-01), Osborne et al.
patent: 6854089 (2005-02-01), Santee et al.
patent: 6934931 (2005-08-01), Plumer et al.
patent: 6934934 (2005-08-01), Osborne et al.
patent: 6944848 (2005-09-01), Hartman et al.
patent: 6948152 (2005-09-01), Dubovsky
patent: 6976246 (2005-12-01), Rosaria et al.
patent: 6993706 (2006-01-01), Cook
patent: 6993747 (2006-01-01), Friedman
patent: 6993748 (2006-01-01), Schaefer
patent: 7000224 (2006-02-01), Osborne et al.
patent: 7024589 (2006-04-01), Hartman et al.
patent: 7047518 (2006-05-01), Little et al.
patent: 7055065 (2006-05-01), Farchi et al.
patent: 7069536 (2006-06-01), Yaung
patent: 7089534 (2006-08-01), Hartman et al.
patent: 7117484 (2006-10-01), Hartman et al.
patent: 7200838 (2007-04-01), Kodosky et al.
patent: 7246307 (2007-07-01), Arora et al.
patent: 7290245 (2007-10-01), Skjolsvold
patent: 7302677 (2007-11-01), Reissman et al.
patent: 7337432 (2008-02-01), Dathathraya et al.
patent: 7624378 (2009-11-01), Achlioptas et al.
patent: 7752502 (2010-07-01), Clee et al.
patent: 7827532 (2010-11-01), Rosaria et al.
patent: 2002/0091968 (2002-07-01), Moreaux et al.
patent: 2002/0152102 (2002-10-01), Brodersen et al.
patent: 2003/0005413 (2003-01-01), Beer et al.
patent: 2003/0034998 (2003-02-01), Kodosky et al.
patent: 2003/0076366 (2003-04-01), Skjolsvold
patent: 2003/0084429 (2003-05-01), Schaefer
patent: 2003/0208351 (2003-11-01), Hartman et al.
patent: 2003/0233600 (2003-12-01), Hartman et al.
patent: 2004/0225919 (2004-11-01), Reissman et al.
patent: 2005/0033732 (2005-02-01), Chang et al.
patent: 2005/0172270 (2005-08-01), Dathathraya et al.
patent: 2005/0257198 (2005-11-01), Stienhans et al.
patent: 2006/0005170 (2006-01-01), Rosaria et al.
patent: 2006/0069782 (2006-03-01), Manning et al.
patent: 2006/0085681 (2006-04-01), Feldstein et al.
patent: 2006/0230319 (2006-10-01), Ryali et al.
Gao et al., “An object state test model: object state diagram”, 1995, IBM Centre for Advanced Studies Conference, pp. 14.
Harry Robinson,“Intelligent Test Automation”, Sep./Oct. 2000. Software Testing & Quality Engineering (STQE) magazine, pp. 23-32, retrieved from <www.harryrobinson.net/intelligent.pdf>.
Jeffery Feldstein,“Model-Based Testing for Java and Web applications”, retrieved from<http://www.sherpas.com/ModelBasedTesting.pdf>, total pp. 8.
Fujiwara et al., “Test Selection Based on Finite State Models”, IEEE Transaciions on Sofiware Engineering, vol. 17, No. 6, Jun. 1991, retrieved from <http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=87284>, pp. 591-603.
Paiva et al., “A Model-to-implementation Mapping Tool for Automated Model-based GUI Testing”, 2005, retrieved from <http://repositorio-aberto.up.pt/bitstream/10216/7068/2/11242.pdf>, total pp. 15.
Berger, Brian, et al., “Model Driven Testing,” DNA Enterprises, inc., Mar. 1997, located on the internet at <http://www.geocities.com/model—based—testing/dna.pdf>, 4 pages.
Levy, Bob, et al., “Advancing Toward Test Automation through Effective Manual Testing,” IBM Datasheet , Rational Software, May 2005, located on the internet at <http://www3.software.ibm.com/ibmdl/pub/software/rational/web/datasheets/rft.pdf>, 13 pages.
Mercury, “Mercury Winrunner,” Mercury Interactive Corp., Data Sheet, 2005, located on the internet at <http://www.mercury.com/us/products/quality-center/functional-testing/winrunner/>, 2 pages.
Schwaber, Carey et al., “Evaluating Automated Functional Testing Tools,” Forrester, Tech Choices, Feb. 3, 2005, 13 pages.
Telelogic, “Software development lifecycle systems testing and integration testing using TTCN-3,” TAU/Tester, located on the internet at <http://www.telelogic.com/corp/products/tau/tester/overview.cfm>, 4 pages.

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