1981-01-26
1983-01-11
Henry, Jon W.
G02B 2126
Patent
active
043679153
ABSTRACT:
An automated microscope specimen slide examination system processes a plurality of microscope specimen slides one at a time for microscopic examination. A specimen slide storage magazine is indexed to position each specimen slide for access by a horizontal feed mechanism which transfers the specimen slide onto a microscope stage which has controllable X, Y and Z axis positioning to move the specimen slide into the optical viewing field of the microscope, focus the image and conduct systematic examination over the desired area of the specimen by X-Y axis incremental motion. At the end of the examination the specimen slide is returned to the magazine and the procedure is repeated for the next specimen slide. Previously examined specimen slides that have been returned to the storage magazine may be automatically returned to the microscope stage for reexamination.
REFERENCES:
patent: 3361031 (1968-01-01), Stroud
patent: 3528735 (1970-09-01), Bluitt et al.
patent: 3738730 (1973-06-01), Binnings et al.
patent: 3851972 (1974-12-01), Smith et al.
Henry Jon W.
Neuner George W.
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