Automatic measurement of cleaning brush nip width for process co

Details Automatic measurement of cleaning brush nip width for process co Automatic measurement of cleaning brush nip width for process co

1996-05-20

1997-07-29

Moses, R. L.

Electrophotography

Diagnostics

Cleaning

399345, 399354, G03G 2100

Patent

active

056529457

ABSTRACT:
A method to evaluate the cleaning performance of brush cleaners by measuring the brush to photoreceptor nip width (e.g cleaning footprint or contact zone) using an ESV sensor or ETAC sensor. This nip width measurement is automatically made using one of the sensing devices. The nip width measurement is converted into diagnostic information using a software algorithm or similar mode of conversion. The diagnostic information can be used in a variety of ways such as a diagnostic tool for a technical representative to warn against the end of brush life, to adjust cleaner biases for automatic changes in setup to achieve better cleaning, to predict brush replacement, to correct brush BPI (i.e. brush to photoreceptor interference) for an under or over engaged brush.

REFERENCES:
patent: 5381218 (1995-01-01), Lundy
patent: 5450186 (1995-09-01), Lundy
patent: 5546177 (1996-08-01), Thayer

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