Automatic inspection apparatus

Geometrical instruments – Area integrators – Electrical

Patent

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Details

G01B 728

Patent

active

041670663

ABSTRACT:
An automatic inspection system for evaluating dimensional and geometrical characteristics of apertures or bores within production parts is disclosed. The system includes a profile sensor, having an outwardly extending probe, that is mounted to a probe manipulator. The probe manipulator is configured for moving the profile sensor so that the tip of the probe moves along axial and circumferential paths of a cylindrical scanning sequence in which the probe tip traces out geometrical elements along the interior contour of the aperture. As the probe tip is moved through the scanning sequence, signals representative of the circumferential and axial position of the probe tip and the radial deflection of the probe tip are periodically supplied to a control circuit that converts these signals to a digital format and controls movement of the probe through the next portion of the scanning sequence. The digit signals, which represent the cylindrical coordinates of various points on the interior surface of the aperture, are coupled to a computational unit that arithmetically determines the value of each geometrical and dimensional characteristic of interest, compares the computed values with permissible tolerances or limits, and supplies a visual indication or permanent record of the evaluation results.

REFERENCES:
patent: 2831258 (1958-04-01), Eisele
patent: 3206857 (1965-09-01), Kaye
patent: 3279079 (1966-10-01), Schiler
patent: 3531868 (1970-10-01), Stevenson
patent: 3750295 (1973-08-01), Nordmann
Tape Controlled "Inspector" by William M. Stocker, American Machinist, 2/9/59, 101-103.

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