Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2005-08-09
2005-08-09
Mehta, Bhavesh M. (Department: 2625)
Image analysis
Pattern recognition
Feature extraction
C345S443000, C345S545000, C382S125000, C382S159000, C382S281000, C382S302000, C382S305000, C707S793000, C707S793000, C707S793000, C707S793000
Reexamination Certificate
active
06928189
ABSTRACT:
A method and system for the extraction of linear features from digital imagery is described herein. The proposed methodology is based on the tridimensional Radon transformation and on the generation of a multi-layer database having separate layers containing different types of information to allow the reconstruction of an output image where the linear features of the input image are restored.
REFERENCES:
patent: 5418892 (1995-05-01), Aghajan et al.
patent: 5561718 (1996-10-01), Trew et al.
patent: 5638465 (1997-06-01), Sano et al.
patent: 6259809 (2001-07-01), Maruo
patent: 6529916 (2003-03-01), Bergman et al.
patent: 6597800 (2003-07-01), Murray et al.
He Dong-Chen
Hemiari Gholamabbas
Morin Denis
Desire Gregory
Goudreau Gage Dubuc
Mehta Bhavesh M.
Niversite de Sherbrooke
LandOfFree
Automatic extraction of linear features from digital imagery does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Automatic extraction of linear features from digital imagery, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Automatic extraction of linear features from digital imagery will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3489654