Automatic door test apparatus

Details Automatic door test apparatus Automatic door test apparatus

1998-11-04

1999-11-09

Ro, Bentsu

Electricity: motive power systems

Automatic and/or with time-delay means

Movement, position, or limit-of-travel

318490, 324537, G01R 3102, E05F 1520

Patent

active

059821256

ABSTRACT:
A test device for testing automatic door systems has a test circuit including a display, a micro-controller, a memory for storing data and a test program, and a control switch for controlling operation of the test program by the micro-controller. The test device is installed by interposing the test circuit between the controller and sensors of the automatic door system. A selector switch on the test device is moveable between first and second positions. When the selector switch is in the first position, it completes a data path between the test circuit and the controller and blocks the exchange of data between the sensors and the test circuit and the first connector. When the selector switch is in the second position, it completes a data path between the test circuit and the second connector and blocks the exchange of data between the controller and the test circuit and the second connector. Pushing the control switch steps the micro-controller through the test program to individually test the controller and each of the sensors.

REFERENCES:
patent: 4491917 (1985-01-01), Higgins et al.
patent: 5127190 (1992-07-01), Hein et al.
patent: 5274312 (1993-12-01), Gerstenkorn

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