Automatic dimension analyzer

Boots – shoes – and leggings

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

358107, 356372, 33 1M, 382 25, G01B 1114, G06K 946, H04N 718

Patent

active

047317450

ABSTRACT:
An automatic dimension analyzer is disclosed which comprises a power driven table on which an object being measured is placed, the table being movable in orthogonal directions, and an optical system for forming an optical image of the object in a sample point field. The sample point field is electronically scanned in a rectangular raster format to produce sample point data bits each representing a sample point having a predetermined optical level. A cursor generator is synchronized with the raster to generate a cursor in the sample point field. A coincidence detector is provided to detect a coincidence between a sample point data bit and the cursor. Measurement instructions are stored in sequentially addressible locations of a memory through a data entry means. A microprocessor addresses the memory locations to retrieve the instructions to cause one of the table and the cursor to move relative to the other so that sample points derived from the object move toward the cursor and detect the position of the table or cursor relative to a reference upon the detection of a coincidence by the coincidence detector.

REFERENCES:
patent: 3865495 (1975-02-01), Morton
patent: 3909519 (1975-09-01), Page, Jr.
patent: 4045772 (1977-08-01), Bouton et al.
patent: 4092669 (1978-05-01), Brasnett
patent: 4183013 (1980-01-01), Agrawala et al.
patent: 4202037 (1980-05-01), Glaser et al.
patent: 4207594 (1980-06-01), Morris et al.
patent: 4295198 (1981-10-01), Copeland et al.
patent: 4301470 (1981-11-01), Pagany
patent: 4352125 (1982-09-01), Guth
patent: 4364086 (1982-12-01), Guth
patent: 4390955 (1983-06-01), Arimura
patent: 4403294 (1983-09-01), Hamada et al.
patent: 4531192 (1985-07-01), Cook
patent: 4538299 (1985-08-01), DeForest
patent: 4541722 (1985-09-01), Jenks
patent: 4630225 (1986-12-01), Hisano
Computer Design, vol. 21, No. 8, Aug. 1982, p. 24, Winchester, Mass., US; J. Aseo: "Machine Vision System Inspects 100% of Manufactured Parts".

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Automatic dimension analyzer does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Automatic dimension analyzer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Automatic dimension analyzer will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1929866

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.