Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent
1991-05-08
1992-11-24
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
324 731, 324603, 324611, G01R 3126, G01R 1320
Patent
active
051666251
ABSTRACT:
Automatic device for measuring the noise level of electronic components. This device comprises selection means (20) to which are connected the components and which are able to select one of these components, measuring means (28) able to determine the noise of the selected component, said measuring means incorporating means (32,34) for biasing the selected component and for processing signals supplied by the thus biased selected component and also incorporating analysis means (36) determining the noise from signals supplied by the processing means, as well as means (10) for controlling the selection means (20) and measuring means (28), said control means (10) being electrically decoupled from the selection means (20) and the biasing and processing means (32,24). Application to the sorting of electronic components following their manufacture.
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Guiga Angelo
Lucas Christian
Commissariat a l''Energie Atomique
Solis Jose M.
Wieder Kenneth A.
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