Image analysis – Pattern recognition – Classification
Reexamination Certificate
2003-01-09
2008-09-23
Le, Brian (Department: 2624)
Image analysis
Pattern recognition
Classification
C382S159000, C382S160000, C382S165000, C382S225000, C382S228000
Reexamination Certificate
active
07428337
ABSTRACT:
The present invention provides a technique for automated selection of a parameterized operator sequence to achieve a pattern classification task. A collection of labeled data patterns is input and statistical descriptions of the inputted labeled data patterns are then derived. Classifier performance for each of a plurality of candidate operator/parameter sequences is determined. The optimal classifier performance among the candidate classifier performances is then identified. Performance metric information, including, for example, the selected operator sequence/parameter combination, will be outputted. The operator sequences selected can be chosen from a default set of operators, or may be a user-defined set. The operator sequences may include any morphological operators, such as, erosion, dilation, closing, opening, close-open, and open-close.
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Boult Terrance E.
Gao Xiang
Ramesh Visvanathan
F. Chau & Associates LLC
Le Brian
Paschburg Donald B.
Siemens Corporate Research Inc.
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