Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2004-03-15
2008-11-11
Cosimano, Edward R (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C324S076110, C702S057000, C702S066000, C702S067000, C702S089000
Reexamination Certificate
active
07451049
ABSTRACT:
In one embodiment, a system comprises a delay determining unit that may be operable to determine a relative delay between the first signal provided by the first source and the second signal provided by the second source, based upon a travel path of the first signal and a travel path of the second signal. In addition, a delay circuit, comprised within the waveform generator, may be configured to be programmed to delay output of the first signal to output the first signal at a predetermined position with respect to output of the second signal, based on the determined relative delay. More specifically, in one embodiment, the delay circuit may be configured to be automatically programmed to add the relative delay to the output of the first signal to automatically align the output of the first signal with respect to the output of the second signal.
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Conway Craig M.
Feiereisel Neil S.
Cosimano Edward R
Hood Jeffrey C.
Meyertons Hood Kivlin Kowert & Goetzel P.C.
National Instruments Corporation
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