Automatic delays for alignment of signals

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C324S076110, C702S057000, C702S066000, C702S067000, C702S089000

Reexamination Certificate

active

07451049

ABSTRACT:
In one embodiment, a system comprises a delay determining unit that may be operable to determine a relative delay between the first signal provided by the first source and the second signal provided by the second source, based upon a travel path of the first signal and a travel path of the second signal. In addition, a delay circuit, comprised within the waveform generator, may be configured to be programmed to delay output of the first signal to output the first signal at a predetermined position with respect to output of the second signal, based on the determined relative delay. More specifically, in one embodiment, the delay circuit may be configured to be automatically programmed to add the relative delay to the output of the first signal to automatically align the output of the first signal with respect to the output of the second signal.

REFERENCES:
patent: 2591738 (1952-04-01), Spencer
patent: 2768348 (1956-10-01), Grumet et al.
patent: 2887653 (1959-05-01), Myers
patent: 2896160 (1959-07-01), Kronacher
patent: 2994822 (1961-08-01), Isley, Jr.
patent: 3070305 (1962-12-01), Chiang
patent: 3866126 (1975-02-01), Cebula et al.
patent: 4569599 (1986-02-01), Bolkow et al.
patent: 4942561 (1990-07-01), Ohishi et al.
patent: 5201061 (1993-04-01), Goldberg et al.
patent: 5253243 (1993-10-01), Suzuki
patent: 5406198 (1995-04-01), Orihashi et al.
patent: 5438259 (1995-08-01), Orihashi et al.
patent: 5633709 (1997-05-01), Ohtaki et al.
patent: 6252890 (2001-06-01), Alger-Meunier et al.
patent: 6556934 (2003-04-01), Higashide
patent: 6865496 (2005-03-01), Camnitz et al.
patent: 7099792 (2006-08-01), Giral et al.
patent: 7177777 (2007-02-01), Giral et al.
patent: 2002/0013672 (2002-01-01), Higashide
patent: 2003/0081667 (2003-05-01), Camnitz et al.
patent: 2003/0125897 (2003-07-01), Higashide
patent: 2005/0190875 (2005-09-01), Feiereisel et al.
patent: 2006/0074584 (2006-04-01), Giral et al.
patent: 2006/0085157 (2006-04-01), Giral et al.
patent: 2006/0150019 (2006-07-01), Yamazaki et al.
patent: 2007/0011634 (2007-01-01), Negishi
patent: 61-14580 (1986-01-01), None
National Instruments, “High-Speed Arbitrary Waveform Generator,” DAQArb 5411 User Manual, Jun. 1997 Edition, Part No. 321558A-01, (2 pages).
The Sony Tektronix, “Arbitrary Waveform Generator.” User Manual VX4792, Copyright 1994, 1995, (5 pages).
Rohde & Schwarz, “I/Q Modulation Generator,” AMIQ Operating Manual, Test and Measurement Division, Copyright 2003, 2004, (10 pages).
Rohde & Schwarz, “Vector Signal Generator R&S SMU200A” Version 02.00 Jun. 2004 (3 pages).
Rohde & Schwarz, “Vector Signal Generator R&S SMU200A CE,” Operating Manual, vols. 1 & 2 1141.2005.02, Jun. 4, 2004, (6 pages).
Agilent Technologies, “Agilent N6030A Arbitrary Waveform Generator 1.25 GS/s, 15 Bit,” Technical Overview, Copyright 2003, 2004, (3 pages).
Agilent Technologies, “Agilent Technologies announces industry's first arbitrary Waveform Generator to Offer Wide Bandwidth, Wide Dynamic Range Signals simultaneously,” ://agilent.com/about
ewsroom/presrel/2004/20sep2004b.html, Sep. 20, 2004, (2 pages).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Automatic delays for alignment of signals does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Automatic delays for alignment of signals, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Automatic delays for alignment of signals will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4045902

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.