Automatic defect review and classification system

Details Automatic defect review and classification system Automatic defect review and classification system

2006-06-13

2010-02-16

Patel, Ramesh B (Department: 2121)

Data processing: generic control systems or specific application

Specific application, apparatus or process

Product assembly or manufacturing

C382S149000, C382S224000, C702S185000

Reexamination Certificate

active

07664562

ABSTRACT:
The invention proposes a system that interrupts a processing associated with an ADC having low priority when an ADC processing cannot catch up with ADR by an ADC alone that is not under execution but uses an ADC for an ADR having high priority. To preferentially execute ADR/ADC having high priority, the invention employs an algorithm for serially selecting ADR/ADC in the order of higher processing capacity (in the order of greater numerical values in the expression by a DPH unit) from among ADR/ADCs that have the lowest priority, no matter whether the ADR/DC is now under execution or not.

REFERENCES:
patent: 5544256 (1996-08-01), Brecher et al.
patent: 6177287 (2001-01-01), Steffan et al.
patent: 6185511 (2001-02-01), Steffan et al.
patent: 6259960 (2001-07-01), Inokuchi
patent: 6408219 (2002-06-01), Lamey et al.
patent: 6438438 (2002-08-01), Takagi et al.
patent: 6456899 (2002-09-01), Gleason et al.
patent: 6483938 (2002-11-01), Hennessey et al.
patent: 6519357 (2003-02-01), Takeuchi
patent: 6542830 (2003-04-01), Mizuno et al.
patent: 6922482 (2005-07-01), Ben-Porath
patent: 7034298 (2006-04-01), Miyai et al.
patent: 7062081 (2006-06-01), Shimoda et al.
patent: 7113628 (2006-09-01), Obara et al.
patent: 2002/0181757 (2002-12-01), Takeuchi
patent: 2004/0188609 (2004-09-01), Miyai et al.
patent: 2004/0234120 (2004-11-01), Honda et al.
patent: 2001-127129 (2001-05-01), None
patent: 2002-310962 (2002-10-01), None
patent: 2004-294360 (2004-10-01), None
Apr. 14, 2008 Office Action issued in U.S. Appl. No. 11,892,583.

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