Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Patent
1997-10-22
2000-03-07
Grant, William
Data processing: generic control systems or specific application
Specific application, apparatus or process
Product assembly or manufacturing
700121, G06F 1900
Patent
active
060352442
ABSTRACT:
A defect management system with a method to update a database with defect data concerning propagator defect data. Defect data obtained from each layer formed on a semiconductor wafer is stored in a relational database. Defect data determined in a current layer to be defect data for a defect observed in a previous layer is defined as data concerning a propagator defect. Propagator defect data is used to update the data in the database relating to the previous layer.
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patent: 5777901 (1998-07-01), Berezin et al.
patent: 5801965 (1998-09-01), Takagi et al.
Chen Ming Chun
Steffan Paul J.
Advanced Micro Devices , Inc.
Garland Steven R.
Grant William
Nelson H. Donald
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