Automatic defect detecting inspection apparatus

Details Automatic defect detecting inspection apparatus Automatic defect detecting inspection apparatus

1979-04-05

1980-09-16

Britton, Howard W.

Facsimile and static presentation processing

Facsimile

Specific signal processing circuitry

250572, 356237, 356430, 358225, H04N 572, H04N 718

Patent

active

042233461

ABSTRACT:
Automatic defect detecting inspection apparatus for detecting defects or imperfections contained in or on a moving slab or strip. The defect detection apparatus utilizes a linear light source for illuminating a selected portion of the slab or sheet surface and an array of optically sensitive elements arranged in side-by-side relationship to scan the surface of the sheet or slab in a direction transverse to the direction of movement to produce an output video signals corresponding to the optical intensity of the area scanned. An anamorphic optical system comprising spaced cylindrical lenses forming a Galilean telescope positioned between the moving material and the optically sensitive elements increases the sensitivity of the optically sensitive elements in the direction of the material movement while maintaining the sensitivity of the optical elements substantially unchanged in the direction transverse to the material movement.

REFERENCES:
patent: 2803755 (1957-08-01), Milford
patent: 3096443 (1963-07-01), Laycak
patent: 3176306 (1965-03-01), Burns
patent: 3803353 (1974-04-01), Sanderson
patent: 3877821 (1975-04-01), Price
patent: 4004152 (1977-01-01), Obser
patent: 4158134 (1979-06-01), Martin

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