Automatic circuit tester control system

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G01R 3128

Patent

active

048752100

ABSTRACT:
Apparatus for providing high speed control of digital test patterns in automatic test equipment, the apparatus including a data random access memory (RAM) storing data of nonsequential vectors, a sequential data memory storing blocks of data of sequential vectors, the sequential data memory having higher capacity than the data RAM, a formatter for receiving data from the data RAM or the sequential data memory and using it to provide inputs to a circuit under test, and a sequence controller controlling selective routing of data from the data RAM or the sequential data memory to the formatter.

REFERENCES:
patent: 4451918 (1984-05-01), Gillette
patent: 4586181 (1986-04-01), Shimizu
patent: 4670879 (1987-06-01), Okino
patent: 4759021 (1988-07-01), Kawaguchi et al.

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