Automatic calibration of a wafer-handling robot

Data processing: generic control systems or specific application – Specific application – apparatus or process – Robot control

Reexamination Certificate

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C700S217000, C700S218000, C700S189000, C700S190000, C700S245000, C700S258000, C700S259000, C700S261000, C700S262000, C700S260000, C700S054000, C700S008000, C318S560000, C901S015000, C901S016000, C901S021000, C901S039000, C340S668000, C701S023000, C118S715000, C118S712000, C118S728000

Reexamination Certificate

active

06934606

ABSTRACT:
In one embodiment, a wafer-handling robot in a wafer processing system is automatically calibrated by determining an orientation of the robot relative to a chassis of the wafer processing system, determining hand-off coordinates of a load port in the wafer processing system, and determining hand-off coordinates of a load lock in the wafer processing system. Also disclosed is a calibration fixture for automatically calibrating the wafer-handling robot to the load port.

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patent: 6327517 (2001-12-01), Sundar
patent: 6591160 (2003-07-01), Hine et al.
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patent: 6648730 (2003-11-01), Chokshi et al.
Lento, Wafer Handling And FAB Automation: Using an integrated controller to manage wafer-handling systems, 2001, Internet, pp. 1-8.
Berkeley Process Control, Inc., Semiconductor Components, 2003, Internet, pp. 1-2.
Robotic alignment overview, Microtool.net; Webpage [online][retrieved on Sep. 22, 2003]; Downloaded from the internet: URL:www.microtool.net.

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