Measuring and testing – By abrasion – milling – rubbing – or scuffing
Patent
1983-08-12
1985-08-27
Levy, Stewart J.
Measuring and testing
By abrasion, milling, rubbing, or scuffing
G01N 356
Patent
active
045370591
ABSTRACT:
An apparatus for quality control testing of semiconductor packages comprises a support platform for holding a device in a fixed location and a reciprocatable brush which is mounted to contact the device with a constant force. The reciprocating mechanism basically moves the brush horizontally across a test package but is linked with a cam system for elevating the brush out of contact with the test package during one of the strokes and lowering the brush back into contact with the test package during the other stroke. Highly accurate and repeatable abrasion tests can thus be performed.
REFERENCES:
patent: 2966790 (1961-01-01), Walker
patent: 3323349 (1967-06-01), Savage et al.
patent: 3929001 (1975-12-01), Lee et al.
patent: 3961521 (1976-06-01), Bailey et al.
patent: 4196611 (1980-04-01), Suga
"Wear Testing Machine", Industrial Laboratory, vol. 40, No. 7, pp. 1082-1083, L. E. Semenov, 1-1975.
Advanced Micro Devices , Inc.
Heslin James M.
King Patrick T.
Levy Stewart J.
Noland Tom
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