Data processing: measuring – calibrating – or testing – Calibration or correction system – Sensor or transducer
Reexamination Certificate
2005-08-16
2005-08-16
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Sensor or transducer
C702S111000, C324S613000
Reexamination Certificate
active
06931341
ABSTRACT:
An apparatus that automatically adjusts self-noise and can lower the lower limit value of a measurement range by reducing the effects of self-noise on measured values. This apparatus corrects self-noise when amplifying an output signal from a sensor so as to conform to a sensor sensitivity G, further processing the amplified signal, and then outputting the processed signal as a measured value. This apparatus includes a sensor sensitivity adjusting circuit that adjusts an amplification factor so as to conform to the sensor sensitivity G, a self-noise value calculating circuit4that calculates a self-noise component F·N from the amplification factor adjusted by the sensor sensitivity adjusting circuit so as to conform to the sensor sensitivity G, and a measured value correcting circuit that calculates a true measured value F·S from the self-noise component F·N calculated by the self-noise value calculating circuit4as well as a measured value L containing the self-noise component F·N.
REFERENCES:
patent: 59-28797 (1984-02-01), None
patent: 04-058615 (1992-02-01), None
patent: 05-034145 (1993-02-01), None
patent: 05334578 (1993-12-01), None
patent: PCT/JP02/04912 (2002-05-01), None
Kobayashi Kazuyoshi
Ohya Masaharu
Takeda Nobuhiko
Takinami Hiroaki
Wakabayashi Tomoharu
Blackman William D.
Bui Bryan
Carrier Joseph P.
Carrier Blackman & Associates P.C.
Rion Co. Ltd.
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