Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2006-05-30
2006-05-30
Wu, Jingge (Department: 2623)
Image analysis
Applications
Manufacturing or product inspection
C382S294000, C348S087000
Reexamination Certificate
active
07054477
ABSTRACT:
An automatic accurate alignment method for a wafer cutting apparatus includes: (a) placing a wafer on a platform, and moving the platform and a camera unit to initial positions; (b) matching the electrical output of the camera unit with a key pattern to find a plurality of adjacent working patterns, and recording center point coordinates of the working patterns; (c) calculating at least one distance value associated with the center point coordinates of a corresponding adjacent pair of the working patterns; (d) determining whether any one calculated distance value complies with a key pattern dimension; and (e) upon determination that there is one calculated distance value that complies with the key pattern dimension, rotating the platform so that an imaginary line interconnecting the center point coordinates that are associated with the determined distance value is disposed parallel to a predetermined wafer cutting direction.
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Greenberg Trauig LLP
Kuhn Jordan
Tapia Pablo E.
Uni-Tek System, Inc.
Wu Jingge
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