Measuring and testing – Sampler – sample handling – etc. – Flow divider – deflector – or interceptor
Patent
1995-09-29
1998-11-03
Noland, Thomas P.
Measuring and testing
Sampler, sample handling, etc.
Flow divider, deflector, or interceptor
73105, 83919, B26D 308, G01B 734
Patent
active
058311815
ABSTRACT:
A modified Atomic Force Microscope (AFM), which can machine and image the surface of a sample with nanometer precision in all three orthogonal directions by varying the depth-of-cut of the sample. A multi-repetitive sensor system is provided as is a radially halved quartered electrode to substantially maintain parallelism or substantial parallelism.
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Dahleh Mohammed
Ismail James Samir
Majumdar Arun
Noland Thomas P.
The Regents of the University of California
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