Automated test pin loading method

Details Automated test pin loading method Automated test pin loading method

1992-07-30

1994-05-03

Vo, Peter Dungba

Metal working

Method of mechanical manufacture

Electrical device making

29593, H05K 1304, G01R 1073

Patent

active

053075609

ABSTRACT:
There is disclosed a method, and apparatus useful in the method, for the automated loading of probes in a probe head intended for use in automated testing of printed circuit boards. The invention automatically places probes in a probe head at on-grid and at off-grid test points, with probes for the latter test points being vertically inclined from base ends which are on-grid to test ends which are off-grid, corresponding to the off-grid test points of the printed circuit board. In the method, the probes are stored in a dispensing unit which is fully populated with on grid probes at a uniform grid spacing. A mask is custom drilled for the circuit under test at on-grid locations and is used to permit transfer of selected probes from the dispensing unit to a probe cassette. The probe cassette is then transferred to a probe loading unit which is loaded with a stack of the probe plates intended for the probe head. The probe plates are independently raised and lowered following a procedure which transfers the probes from the probe cassette into the probe plates.

REFERENCES:
patent: 3765075 (1973-10-01), Olney, Jr. et al.
patent: 4736522 (1988-04-01), Larson
patent: 4774459 (1988-09-01), Maelzer et al.
patent: 4825538 (1989-05-01), Kubis

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