Automated test pin loading apparatus

Metal working – Means to assemble or disassemble – With means to test work or product

Patent

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Details

29593, 29739, 324758, 324761, B23Q 522, G01R 3126, H05K 300

Patent

active

055113044

ABSTRACT:
There is disclosed an apparatus for the automated loading of probes in a probe head intended for use in automated testing of printed circuit boards. The invention automatically places probes in a probe head at on-grid and at off-grid test points, with probes for the latter test points being vertically inclined from base ends which are on-grid to test ends which are off-grid, corresponding to the off-grid test points of the printed circuit board. In the method, the probes are stored in a dispensing unit which is fully populated with on grid probes at a uniform grid spacing. A mask is custom drilled for the circuit under test at on-grid locations and is used to permit transfer of selected probes from the dispensing unit to a probe cassette. The probe cassette is then transferred to a probe loading unit which is loaded with a stack of the probe plates intended for the probe head. The probe plates are independently raised and lowered following a procedure which transfers the probes from the probe cassette into the probe plates.

REFERENCES:
patent: 4357062 (1982-11-01), Everett
patent: 4535536 (1985-08-01), Wyss
patent: 4736522 (1988-04-01), Larson
patent: 4774459 (1988-09-01), Maelzer et al.
patent: 5357671 (1994-10-01), Gladik et al.
DeMarco et al "Pin-Insertion Process" IBM Technical Disclosure Bulletin, vol. 22, No. 4, Sep. 1979, p. 1419.

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